Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode
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Date
2018-10
Open Access Location
Journal Title
Journal ISSN
Volume Title
Publisher
MDPI (Basel, Switzerland)
Rights
(c) 2018 The Author/s
CC BY
CC BY
Abstract
In this work PeakForce tapping (PFT) imaging was demonstrated with carbon nanotube atomic force microscopy (CNT-AFM) probes; this imaging mode shows great promise for providing simple, stable imaging with CNT-AFM probes, which can be difficult to apply. The PFT mode is used with CNT-AFM probes to demonstrate high resolution imaging on samples with features in the nanometre range, including a Nioprobe calibration sample and gold nanoparticles on silicon, in order to demonstrate the modes imaging effectiveness, and to also aid in determining the diameter of very thin CNT-AFM probes. In addition to stable operation, the PFT mode is shown to eliminate "ringing" artefacts that often affect CNT-AFM probes in tapping mode near steep vertical step edges. This will allow for the characterization of high aspect ratio structures using CNT-AFM probes, an exercise which has previously been challenging with the standard tapping mode.
Description
Keywords
PeakForce tapping mode, atomic force microscope tips, carbon nanotubes, imaging artefacts, tapping mode
Citation
Slattery AD, Shearer CJ, Shapter JG, Blanch AJ, Quinton JS, Gibson CT. (2018). Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode.. Nanomaterials (Basel). 8. 10. (pp. E807-).