Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode

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dc.citation.issue10
dc.citation.volume8
dc.contributor.authorSlattery AD
dc.contributor.authorShearer CJ
dc.contributor.authorShapter JG
dc.contributor.authorBlanch AJ
dc.contributor.authorQuinton JS
dc.contributor.authorGibson CT
dc.coverage.spatialSwitzerland
dc.date.accessioned2023-12-04T22:45:47Z
dc.date.accessioned2024-07-25T06:36:29Z
dc.date.available2018-10-09
dc.date.available2023-12-04T22:45:47Z
dc.date.available2024-07-25T06:36:29Z
dc.date.issued2018-10
dc.description.abstractIn this work PeakForce tapping (PFT) imaging was demonstrated with carbon nanotube atomic force microscopy (CNT-AFM) probes; this imaging mode shows great promise for providing simple, stable imaging with CNT-AFM probes, which can be difficult to apply. The PFT mode is used with CNT-AFM probes to demonstrate high resolution imaging on samples with features in the nanometre range, including a Nioprobe calibration sample and gold nanoparticles on silicon, in order to demonstrate the modes imaging effectiveness, and to also aid in determining the diameter of very thin CNT-AFM probes. In addition to stable operation, the PFT mode is shown to eliminate "ringing" artefacts that often affect CNT-AFM probes in tapping mode near steep vertical step edges. This will allow for the characterization of high aspect ratio structures using CNT-AFM probes, an exercise which has previously been challenging with the standard tapping mode.
dc.format.paginationE807-
dc.identifier.author-urlhttps://www.ncbi.nlm.nih.gov/pubmed/30304791
dc.identifier.citationSlattery AD, Shearer CJ, Shapter JG, Blanch AJ, Quinton JS, Gibson CT. (2018). Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode.. Nanomaterials (Basel). 8. 10. (pp. E807-).
dc.identifier.doi10.3390/nano8100807
dc.identifier.eissn2079-4991
dc.identifier.elements-typejournal-article
dc.identifier.issn2079-4991
dc.identifier.numberARTN 807
dc.identifier.piinano8100807
dc.identifier.urihttps://mro.massey.ac.nz/handle/10179/70528
dc.languageeng
dc.publisherMDPI (Basel, Switzerland)
dc.relation.isPartOfNanomaterials (Basel)
dc.rights(c) 2018 The Author/s
dc.rightsCC BY
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.subjectPeakForce tapping mode
dc.subjectatomic force microscope tips
dc.subjectcarbon nanotubes
dc.subjectimaging artefacts
dc.subjecttapping mode
dc.titleImproved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode
dc.typeJournal article
pubs.elements-id452271
pubs.organisational-groupOther
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